rus
Issue #10/2022
Sh. Shugaepov, E. Ermolaev, V. Egoshin, E. Shakirova
METROLOGICAL SUPPORT OF ZPP JSC AS A TOOL TO IMPROVE PRODUCT QUALITY
METROLOGICAL SUPPORT OF ZPP JSC AS A TOOL TO IMPROVE PRODUCT QUALITY
DOI: 10.22184/1992-4178.2022.221.10.52.56
The article considers the metrological support of “Plant of Semiconductor Devices” JSC (ZPP JSC). It is noted that in ensuring high quality indicators of the developed products, the primary role belongs to reliable measurements of technical parameters: without correctly performed measurements it is impossible to estimate the quality and reliability of products.
The article considers the metrological support of “Plant of Semiconductor Devices” JSC (ZPP JSC). It is noted that in ensuring high quality indicators of the developed products, the primary role belongs to reliable measurements of technical parameters: without correctly performed measurements it is impossible to estimate the quality and reliability of products.
Теги: dilatometer metal-ceramic package metrological support x-ray fluorescence analyzer дилатометр металлокерамический корпус метрологическое обеспечение рентгенофлуоресцентный анализатор
METROLOGICAL SUPPORT OF ZPP JSC AS A TOOL TO IMPROVE PRODUCT QUALITY
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