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EXPERIENCE IN IMPLEMENTING NEW AUTOMATED TEST EQUIPMENT AT CREMNY EL GROUP JSC PRODUCTION FACILITY Cremny El Group JSC has developed and put into production the new automated test equipment based on crate measuring systems to enable voltage regulator chip testing.
LIQUID-CRYSTAL BASED DEVICES FOR TERAHERTZ RADIATION MODULATION The article discusses the problems associated with the use of terahertz waves in information processing devices, optoelectronics, microwave electronics and medicine.
MILLIMETER WAVE СONNECTORS. MATERIALS FOR DIELECTRIC BEARING DISKS The article analyzes the design features of millimeter wave connectors and the requirements for dielectric bearing disks materials. It presents the statistical data on the use of polymers in mm-wave connectors from more than 30 companies in the USA, Europe and Southeast Asia. The possibilities of using domestic polymers in mm-wave connectors are considered.
OSCILLATORS BASED ON DIELECTRIC RESONATORS. Part 3 The article considers the oscillators with phase locked loop (PLL). It provides the information on characteristics and manufacturers of these devices.
POWER MICROWAVE AND SWITCHING GaN TRANSISTORS NIIET JSC developed a series of 400 W power microwave transistors for frequency range up to 1,6 GHz and 80 W power microwave transistors for frequency range up to 12 GHz. It also presented a series of power switching transistors with a drain-source voltage of 100, 200 and 650 V.
CONFORMALLY INTEGRATED ELECTRONIC COMPONENTS OF FLEXIBLE PRINTED ELECTRONICS FOR INTERNET OF PEOPLE The article discusses the combination of design and technological solutions and the practical implementation of the conformally integrated electronic components of flexible printed electronics, which can be effectively used in Internet of People systems.
HETEROGENEOUS INTEGRATION AS ONE OF THE WAYS OUT OF THE RUSSIAN MICROELECTRONICS CRISIS The article analyzes the development of heterogeneous integration technologies in microelectronics and associated changes in the structure of the industry. Heterogeneous integration is proposed as one of the ways to solve the problem of electronic components in domestic electronic industry.
HARDWARE SUPPORT FOR VIRTUALIZATION OF ELBRUS ARCHITECTURE Virtualization of computing resources can significantly increase the equipment utilization and security level especially in cloud computing. The article describes the basic hardware support for virtualization implemented in version 6 of Elbrus command system.
VIRTUALIZATION OF ELBRUS MICROPROCESSOR INTERRUPT SUBSYSTEM The article considers the hardware and software solutions developed for Elbrus architecture aimed at improving the efficiency of interrupt subsystem virtualization. It is noted that these solutions are mainly based on hardware support provided by specially developed hardware controller (Elbrus Programmable Interrupt Controller, EPIC).
PRODUCTION FACILITIES SHARING IN A DIGITAL ECONOMY The article discusses the possibility of sharing production facilities owned by workshops, laboratories and individuals by creating a sharing platform for the provision of services for the production of goods and equipment leasing.
UNIVERSAL NETWORK PLATFORM FOR SENSOR DATA ACQUISITION AND METER CONTROL The article presents an effective platform developed by Milandr for utility metering systems, a flexible network solution that allows not only to meter electricity, heat, water, gas, but also to monitor and ensure the safety of the premises.
MULTILAYER CERAMIC PCB PRODUCTION The article considers the main steps of ceramic printed circuit boards manufacturing process, technological nuances and features of the production cycle implemented by TESTPRIBOR JSC. It shows the practical and technological value of technical ceramics as a material for the manufacture of printed circuit boards.
CORRELATION OF PARAMETERS AFFECTING THE RELIABILITY OF PRINTED CIRCUIT BOARDS The article discusses the PCB design and conductive structure parameters which can to some extent play the role of criteria for its reliability, as well as their interdependence, which does not allow achieving the best performance for all criteria at the same time.
MICROELECTRONICS MANUFACTURING TECHNOLOGIES: DEVELOPMENT CHALLENGES. Part 2 The article considers some aspects of the development of microelectronics technologies: ALD and CVD processes, ion implantation, EUV lithography, testing method improvement.