rus
Competent opinion
Column of radio-electronic industry department
Report from a company
Yu. Kovalevsky
FOCUS ON COMPLEX PRODUCTS AS A COMPETITIVE ADVANTAGE VISIT TO THE PRODUCTION FACILITY OF NKT CJSC DOI: 10.22184/1992-4178.2026.258.6.36.46
FOCUS ON COMPLEX PRODUCTS AS A COMPETITIVE ADVANTAGE VISIT TO THE PRODUCTION FACILITY OF NKT CJSC DOI: 10.22184/1992-4178.2026.258.6.36.46
Industry Events
E. Kasparova
EXPERT SESSION “ELECTRONICS MARKETING: HOW COMPLEX ENGINEERING SOLUTIONS REACH THE MARKET” AT EXPOELECTRONICA | EXPOCIFRA 2026 DOI: 10.22184/1992-4178.2026.258.6.28.34
EXPERT SESSION “ELECTRONICS MARKETING: HOW COMPLEX ENGINEERING SOLUTIONS REACH THE MARKET” AT EXPOELECTRONICA | EXPOCIFRA 2026 DOI: 10.22184/1992-4178.2026.258.6.28.34
Manufacturing equipment and process materials
D. Potseluev
NOTHING LASTS FOREVER UNDER ROSIN: A NEW GENERATION OF RUSSIAN FLUXES DOI: 10.22184/1992-4178.2026.258.6.136.140
The article provides an overview of the Solius line of soldering fluxes from Ostec-Integra, describing their compositions, associated manufacturing processes and application features. Continuous development of new formulations allows the company to ensure its products meet modern technological challenges.
NOTHING LASTS FOREVER UNDER ROSIN: A NEW GENERATION OF RUSSIAN FLUXES DOI: 10.22184/1992-4178.2026.258.6.136.140
The article provides an overview of the Solius line of soldering fluxes from Ostec-Integra, describing their compositions, associated manufacturing processes and application features. Continuous development of new formulations allows the company to ensure its products meet modern technological challenges.
Tags: import substitution selective soldering soldering flux wave soldering импортозамещение пайка волной паяльный флюс селективная пайка
CAD
S. Smolov, A. Kotsynyak, A. Kamkin
DOMESTIC SOFTWARE TOOLS FOR STATIC CODE ANALYSIS, LOGICAL SYNTHESIS AND LOGICAL EQUIVALENCE VERIFICATION FOR DIGITAL VLSI CAD SYSTEMS The Institute for System Programming of the Russian
Academy of Sciences (ISP RAS) is participating in a program
to develop domestic CAD systems for digital VLSI circuits. The article discusses the key functionalities of the static code analysis, logic synthesis and logical equivalence verification tools for digital VLSI circuits developed at the ISP RAS.
DOMESTIC SOFTWARE TOOLS FOR STATIC CODE ANALYSIS, LOGICAL SYNTHESIS AND LOGICAL EQUIVALENCE VERIFICATION FOR DIGITAL VLSI CAD SYSTEMS The Institute for System Programming of the Russian
Academy of Sciences (ISP RAS) is participating in a program
to develop domestic CAD systems for digital VLSI circuits. The article discusses the key functionalities of the static code analysis, logic synthesis and logical equivalence verification tools for digital VLSI circuits developed at the ISP RAS.
Tags: : digital vlsi logical equivalence and design rule checking logic synthesis static code analysis tool инструмент статического анализа кода логический синтез проверка логической эквивалентности и правил проектирования цифровые сбис
A. Nikitin, Ya. Ovchinnikov, L. Pereverzev, A. Chasovskikh
DFT AND ATPG SOFTWARE TOOLS FOR THE DIGITAL VLSI DESIGN FLOW DOI: 10.22184/1992-4178.2026.258.6.60.65
IC testing at all stages, from design to production, is a key quality control tool. The proposed testability assurance concept allows for the addition of hardware to the VLSI design during the design process, providing access to critical circuit elements for the most comprehensive testing
DFT AND ATPG SOFTWARE TOOLS FOR THE DIGITAL VLSI DESIGN FLOW DOI: 10.22184/1992-4178.2026.258.6.60.65
IC testing at all stages, from design to production, is a key quality control tool. The proposed testability assurance concept allows for the addition of hardware to the VLSI design during the design process, providing access to critical circuit elements for the most comprehensive testing
Tags: ach_dft and cadence modus software tools : testability test vectors программные инструменты ach_dft и cadence modus тестируемость тестовые векторы
V. Sazonov, M. Khapaev, M. Sheblaev, R. Erokhin, V. Serov
DEVELOPMENT OF SOFTWARE COMPONENTS FOR PHYSICAL SYNTHESIS AND VERIFICATION OF VLSI FOR DIGITAL DESIGN FLOW The development of domestic design flows is a joint effort between leading design centers and research institutes. The article discusses the features of high-level synthesis, static analysis, physical design and other software tools developed at Lomonosov Moscow State University for the digital VLSI design flow.
DEVELOPMENT OF SOFTWARE COMPONENTS FOR PHYSICAL SYNTHESIS AND VERIFICATION OF VLSI FOR DIGITAL DESIGN FLOW The development of domestic design flows is a joint effort between leading design centers and research institutes. The article discusses the features of high-level synthesis, static analysis, physical design and other software tools developed at Lomonosov Moscow State University for the digital VLSI design flow.
Tags: digital vlsi design flow parasitic element extractor physical synthesis tool universal database инструмент физического синтеза маршрут проектирования цифровых сбис универсальная база данных экстрактор паразитных элементов
N. Malyshev, I. Belyutin, S. Rybkin, A. Borisov
CHIP VERIFICATION. CHALLENGES, SOLUTIONS AND THE CURRENT SITUATION IN THE DIGITAL VLSI CAD VERIFICATION MARKET The Russian company EREMEX is developing tools for simulation and functional verification of digital designs. A number
of the company’s developments are used in the development
of domestic microelectronic hardware design flows.
CHIP VERIFICATION. CHALLENGES, SOLUTIONS AND THE CURRENT SITUATION IN THE DIGITAL VLSI CAD VERIFICATION MARKET The Russian company EREMEX is developing tools for simulation and functional verification of digital designs. A number
of the company’s developments are used in the development
of domestic microelectronic hardware design flows.
Tags: cad chip functional physical verification vlsi верификация сапр сбис физическая функциональная чип
A. Andreev, A. Bardushkin, E. Demidov, V. Kartashev, E. Kozhevnikov, I. Mkrtychan, I. Nazarov, L. Pereverzev, K. Selina, E. Sereda, A. Tretyakov, I. Shulepov, Yu. Yusipova
SOFTWARE TOOLS FOR SIGNAL INTEGRITY ANALYSIS, IR DROP ON POWER RAILS AND ELECTROMIGRATION EFFECT ANALYSIS FOR THE DIGITAL VLSI DESIGN FLOW DOI: 10.22184/1992-4178.2026.258.6.76.83
The article presents software tools for signal integrity analysis (ACH_SI), IR drop on power rails and electromigration effect analysis (ACH_EMIR) for the digital VLSI design flow,
as well as a linear circuit simulator designed for integration with the ACH_SI and ACH_EMIR software tools. These tools were developed by Alfachip LLC.
SOFTWARE TOOLS FOR SIGNAL INTEGRITY ANALYSIS, IR DROP ON POWER RAILS AND ELECTROMIGRATION EFFECT ANALYSIS FOR THE DIGITAL VLSI DESIGN FLOW DOI: 10.22184/1992-4178.2026.258.6.76.83
The article presents software tools for signal integrity analysis (ACH_SI), IR drop on power rails and electromigration effect analysis (ACH_EMIR) for the digital VLSI design flow,
as well as a linear circuit simulator designed for integration with the ACH_SI and ACH_EMIR software tools. These tools were developed by Alfachip LLC.
Tags: crosstalk electromigration effect signal integrity analysis spice simulation spice-моделирование анализ целостности сигналов перекрестные помехи эффект электромиграции
A. Zinchenko, A. Kogai, E. Ivanova
DEVELOPMENT OF DOMESTIC CAD SYSTEMS FOR MICROWAVE AND ANALOG ICs: STATUS, ISSUES, PROSPECTS DOI: 10.22184/1992-4178.2026.258.6.84.90
In Russia, within the framework of the state program for the development of electronic engineering until 2030, two projects are being implemented - basic versions of CAD for microwave and analog ICs. The article discusses the results achieved, the lessons learned during the project and current issues in the development of the domestic CAD system.
DEVELOPMENT OF DOMESTIC CAD SYSTEMS FOR MICROWAVE AND ANALOG ICs: STATUS, ISSUES, PROSPECTS DOI: 10.22184/1992-4178.2026.258.6.84.90
In Russia, within the framework of the state program for the development of electronic engineering until 2030, two projects are being implemented - basic versions of CAD for microwave and analog ICs. The article discusses the results achieved, the lessons learned during the project and current issues in the development of the domestic CAD system.
Tags: analog ic cad circuit simulation module microwave ic cad parasitic parameter extractor physical verification process design kit комплект средств проектирования модуль схемотехнического моделирования сапр аналоговых ис сапр свч ис физическая верификация экстрактор паразитных параметров
T. Krupkina, A. Krasyukov, V. Losev, Yu. Chaplygin, D. Bulakh, D. Ryzhova, A. Korshunov, A. Pereverzev
DEVELOPMENT OF A DOMESTIC LINE OF SOFTWARE FOR MICROELECTRONIC PRODUCTION A software package for two-dimensional device-technological simulation of silicon CMOS and BCD technologies has been developed. It is intended for use as a tool for developing new
and improving existing technological routes for the creation
of silicon integrated circuits, as well as for developing a new element base for enterprises in the electronics industry.
DEVELOPMENT OF A DOMESTIC LINE OF SOFTWARE FOR MICROELECTRONIC PRODUCTION A software package for two-dimensional device-technological simulation of silicon CMOS and BCD technologies has been developed. It is intended for use as a tool for developing new
and improving existing technological routes for the creation
of silicon integrated circuits, as well as for developing a new element base for enterprises in the electronics industry.
Tags: cad cmos device-technological simulation photomask design кмоп приборно-технологическое моделирование проектирование фотошаблонов сапр
V. Ukhin, V. Kukharuk, D. Kolomensky, V. Dvornikov
CALCULATING PCB CROSSTALK IN THE TIME DOMAIN USING SimPCB Lite Calculating and monitoring crosstalk is one of the challenges
of ensuring signal integrity on a printed circuit board (PCB).
The article discusses a method for calculating crosstalk
in the time domain using S-parameters, implemented
in the SimPCB Lite CAD system.
CALCULATING PCB CROSSTALK IN THE TIME DOMAIN USING SimPCB Lite Calculating and monitoring crosstalk is one of the challenges
of ensuring signal integrity on a printed circuit board (PCB).
The article discusses a method for calculating crosstalk
in the time domain using S-parameters, implemented
in the SimPCB Lite CAD system.
Tags: aggressor line crosstalk signal integrity analysis s-parameters s-параметры time domain analysis анализ целостности сигналов временной анализ линия-агрессор перекрестные помехи
Data Collection, Processing and Communication Systems
O. Spiridonov, L. Mileshko, S. Yurchenko
NEURAL NETWORK-BASED METHODOLOGY FOR DESIGNING HARDWARE AND SOFTWARE SYSTEMS AND RADIO CHANNELS FOR REMOTE ENVIRONMENTAL MONITORING DOI: 10.22184/1992-4178.2026.258.6.160.163
The article presents an overview of modern neural network-based approaches to designing hardware and software systems and radio channels. Methods for training neural networks
used to process multidimensional data sets in environmental monitoring tasks are analyzed.
NEURAL NETWORK-BASED METHODOLOGY FOR DESIGNING HARDWARE AND SOFTWARE SYSTEMS AND RADIO CHANNELS FOR REMOTE ENVIRONMENTAL MONITORING DOI: 10.22184/1992-4178.2026.258.6.160.163
The article presents an overview of modern neural network-based approaches to designing hardware and software systems and radio channels. Methods for training neural networks
used to process multidimensional data sets in environmental monitoring tasks are analyzed.
Tags: cad environmental monitoring genetic algorithms hardware and software systems neural networks аппаратно-программные комплексы генетические алгоритмы нейронные сети сапр экологический мониторинг
Test & Measurements
O. Chuprinova
DETECTING HEATING ANOMALIES IN PRINTED CIRCUIT ASSEMBLY COMPONENTS The article presents a model for active thermal monitoring of printed circuit assembly components based on the identification
of the parameters of a lumped-element RC thermal model.
A method for estimating the parameters using a heating curve under stepped thermal power application is proposed.
DETECTING HEATING ANOMALIES IN PRINTED CIRCUIT ASSEMBLY COMPONENTS The article presents a model for active thermal monitoring of printed circuit assembly components based on the identification
of the parameters of a lumped-element RC thermal model.
A method for estimating the parameters using a heating curve under stepped thermal power application is proposed.
Tags: electronic equipment printed circuit assemblies thermographic diagnostics печатные узлы рэа термографическая диагностика
E. Morozov, I. Glotov
PHASE-COHERENT SYSTEM FOR TESTING APAAs BASED ON A RADIO CHANNEL EMULATOR DOI: 10.22184/1992-4178.2026.258.6.110.116
The article discusses a method for developing a phase-coherent system based on a radio channel emulator, which is used for testing active phased arrays (APAAs), MIMO systems, spatially diverse receiving paths and phase direction finders during the development and acceptance testing stages.
PHASE-COHERENT SYSTEM FOR TESTING APAAs BASED ON A RADIO CHANNEL EMULATOR DOI: 10.22184/1992-4178.2026.258.6.110.116
The article discusses a method for developing a phase-coherent system based on a radio channel emulator, which is used for testing active phased arrays (APAAs), MIMO systems, spatially diverse receiving paths and phase direction finders during the development and acceptance testing stages.
Tags: active phased arrays (apaas) frequency synchronization phase-coherent system radio channel emulator афар фазокогерентная система частотная синхронизация эмулятор радиоканала
Microwave electronics
V. Shalomanov
IMPORT SUBSTITUTION OF MICROWAVE COMPONENTS: PROVEN DOMESTIC EQUIVALENTS OF FOREIGN COMPONENTS FROM RADIANT-EK JSC DOI: 10.22184/1992-4178.2026.258.6.118.124
The introduction of domestic microwave components is currently considered as a strategic direction for developers of RF electronic equipment. The article describes the characteristics and advantages of domestically produced high-frequency connectors, active and passive microwave devices manufactured by Radiant-EK JSC which are fully compatible with their foreign counterparts.
IMPORT SUBSTITUTION OF MICROWAVE COMPONENTS: PROVEN DOMESTIC EQUIVALENTS OF FOREIGN COMPONENTS FROM RADIANT-EK JSC DOI: 10.22184/1992-4178.2026.258.6.118.124
The introduction of domestic microwave components is currently considered as a strategic direction for developers of RF electronic equipment. The article describes the characteristics and advantages of domestically produced high-frequency connectors, active and passive microwave devices manufactured by Radiant-EK JSC which are fully compatible with their foreign counterparts.
Tags: frequency multiplier low-noise amplifier microwave bandpass filter microwave power amplifier rf coaxial connectors : вч коаксиальные соединители малошумящий усилитель полосовой свч-фильтр свч усилитель мощности умножитель частоты
V. Kochemasov, T. Kosichkina
GaN TRANSISTORS. PART 3 DOI: 10.22184/1992-4178.2026.258.6.126.135
The article considers the characteristics and features of high electron mobility transistors based on gallium nitride. Information on transistors from domestic and foreign manufacturers designed for use in microwave power amplifiers is provided.
GaN TRANSISTORS. PART 3 DOI: 10.22184/1992-4178.2026.258.6.126.135
The article considers the characteristics and features of high electron mobility transistors based on gallium nitride. Information on transistors from domestic and foreign manufacturers designed for use in microwave power amplifiers is provided.
Tags: gallium nitride high electron mobility transistors microwave devices power amplifiers wide band gap нитрид галлия свч-устройства транзисторы с высокой подвижностью электронов усилители мощности широкая запрещенная зона
Reliability and tests
A. Trushina
WHY IS THE CLASSICAL ION CHROMATOGRAPHY METHOD FAILING TO MEET THE NEW DEMANDS OF THE MICROELECTRONICS INDUSTRY? DOI: 10.22184/1992-4178.2026.258.6.152.158
The article discusses a microchip ion chromatography method for monitoring the purity of process materials in the microelectronics industry. It reduces the risk of false contamination due to sample contact with other environments and enables more productive
and cost-effective contaminant monitoring directly
at the production line. The main applications and development prospects of this method are reviewed.
WHY IS THE CLASSICAL ION CHROMATOGRAPHY METHOD FAILING TO MEET THE NEW DEMANDS OF THE MICROELECTRONICS INDUSTRY? DOI: 10.22184/1992-4178.2026.258.6.152.158
The article discusses a microchip ion chromatography method for monitoring the purity of process materials in the microelectronics industry. It reduces the risk of false contamination due to sample contact with other environments and enables more productive
and cost-effective contaminant monitoring directly
at the production line. The main applications and development prospects of this method are reviewed.
Tags: cleanroom atmosphere monitoring microchip ion chromatography process material purity ultra-pure water monitoring контроль ультрачистой воды микрочиповая ионная хроматография мониторинг атмосферы чистых комнат чистота технологических материалов
Training & Education
M. Smirnova, I. Arapova
SOCIAL ASPECTS OF DEVELOPING AN ENGINEERING CULTURE: THE CASE OF NIIME JSC NIIME has developed and structured a methodology for developing an engineering culture, including practice-oriented learning,
a motivational and value-based system for youth adaptation,
the use of AI in education, a system of continuous education
and engineering creativity.
SOCIAL ASPECTS OF DEVELOPING AN ENGINEERING CULTURE: THE CASE OF NIIME JSC NIIME has developed and structured a methodology for developing an engineering culture, including practice-oriented learning,
a motivational and value-based system for youth adaptation,
the use of AI in education, a system of continuous education
and engineering creativity.
Tags: ai continuous education system engineering culture mentoring practice-oriented learning ии инженерная культура наставничество практико-ориентированное обучение система непрерывного образования
for Engineers
Production technologies
S. Vorobyov
WHAT IS THE OPTIMAL FREQUENCY FOR ULTRASONIC MICROWELDING OF WIRE JOINTS? DOI: 10.22184/1992-4178.2026.258.6.142.146
The article analyzes the characteristics and limitations of various ultrasonic microwelding frequency modes. Higher frequencies allow for high-quality joints with less wire deformation. On the other hand, lower frequencies are preferable for rough surfaces: due to the greater oscillation amplitude, the tool more effectively smooths out microscopic irregularities.
WHAT IS THE OPTIMAL FREQUENCY FOR ULTRASONIC MICROWELDING OF WIRE JOINTS? DOI: 10.22184/1992-4178.2026.258.6.142.146
The article analyzes the characteristics and limitations of various ultrasonic microwelding frequency modes. Higher frequencies allow for high-quality joints with less wire deformation. On the other hand, lower frequencies are preferable for rough surfaces: due to the greater oscillation amplitude, the tool more effectively smooths out microscopic irregularities.
Tags: contact pad deformation ultrasonic microwelding ultrasonic transducer деформация контактная площадка ультразвуковая микросварка ультразвуковой преобразователь
R. Shakhmaeva, G. Irzaev
TECHNOLOGY OF GOLD IMPURITY DIFFUSION INTO THE ACTIVE REGION OF A POWER TRANSISTOR CRYSTAL STRUCTURE DOI: 10.22184/1992-4178.2026.258.6.148.151
The article considers the mechanism for reducing the carrier lifetime in a silicon transistor crystal by diffusing gold into the collector region. A technology for diffusion doping of silicon with gold is proposed to increase the carrier capture cross-section and reduce their lifetime, thereby improving the performance
of a high-power transistor.
TECHNOLOGY OF GOLD IMPURITY DIFFUSION INTO THE ACTIVE REGION OF A POWER TRANSISTOR CRYSTAL STRUCTURE DOI: 10.22184/1992-4178.2026.258.6.148.151
The article considers the mechanism for reducing the carrier lifetime in a silicon transistor crystal by diffusing gold into the collector region. A technology for diffusion doping of silicon with gold is proposed to increase the carrier capture cross-section and reduce their lifetime, thereby improving the performance
of a high-power transistor.