rus
Competent opinion
P. Kutsko
YOU CANNOT PROMOTE WHAT YOU DON’T TRUST IN DOI: 10.22184/1992-4178.2021.207.6.12.17
YOU CANNOT PROMOTE WHAT YOU DON’T TRUST IN DOI: 10.22184/1992-4178.2021.207.6.12.17
A. Mokhnatkin
NEUROPROCESSORS HELP DIAGNOSE CORONAVIRUS DOI: 10.22184/1992-4178.2021.207.6.18.20
NEUROPROCESSORS HELP DIAGNOSE CORONAVIRUS DOI: 10.22184/1992-4178.2021.207.6.18.20
Exhibitions & Conferences
Yu. Kovalevsky
WAYS OF PROCUREMENT LEGISLATION ENHANCEMENT MEETING OF THE MILITARY AND INDUSTRIAL POLICY AND BUDGET SECTION OF THE EXPERT COUNCIL OF THE FEDERATION COUNCIL COMMITTEE ON DEFENSE AND SECURITY DOI: 10.22184/1992-4178.2021.207.6.36.38
WAYS OF PROCUREMENT LEGISLATION ENHANCEMENT MEETING OF THE MILITARY AND INDUSTRIAL POLICY AND BUDGET SECTION OF THE EXPERT COUNCIL OF THE FEDERATION COUNCIL COMMITTEE ON DEFENSE AND SECURITY DOI: 10.22184/1992-4178.2021.207.6.36.38
Yu. Kovalevsky
ANNIVERSARY OF “ELECTROMAGNETIC COMPATIBILITY” “EMC” THE 10th ALL-RUSSIA SCIENCE AND TECHNOLOGY CONFERENCE DOI: 10.22184/1992-4178.2021.207.6.40.42
ANNIVERSARY OF “ELECTROMAGNETIC COMPATIBILITY” “EMC” THE 10th ALL-RUSSIA SCIENCE AND TECHNOLOGY CONFERENCE DOI: 10.22184/1992-4178.2021.207.6.40.42
Event of Issue
Yu. Kovalevsky
PLENARY SESSION OF “INTELLIGENCE OF MACHINES AND MECHANISMS” INTERNATIONAL INDUSTRIAL FORUM DOI: 10.22184/1992-4178.2021.207.6.30.35
PLENARY SESSION OF “INTELLIGENCE OF MACHINES AND MECHANISMS” INTERNATIONAL INDUSTRIAL FORUM DOI: 10.22184/1992-4178.2021.207.6.30.35
Economy & Business
A. Brykin
SOURCES OF SYSTEMIC PROBLEMS IN THE DEVELOPMENT OF RADIO-ELECTRONIC AND ELECTRONIC INDUSTRY IN RUSSIA. Part 3. 1950‒1990 DOI: 10.22184/1992-4178.2021.207.6.130.138
The development of the industrial and technological complex of electronic and radio-electronic industry is associated with priorities in the development of industry and the country as a whole. The article analyzes the current situation in the industry. An attempt is made to answer the question: is it possible to reverse the situation that has formed due to a series of strategic miscalculations of the past periods of the country’s development.
SOURCES OF SYSTEMIC PROBLEMS IN THE DEVELOPMENT OF RADIO-ELECTRONIC AND ELECTRONIC INDUSTRY IN RUSSIA. Part 3. 1950‒1990 DOI: 10.22184/1992-4178.2021.207.6.130.138
The development of the industrial and technological complex of electronic and radio-electronic industry is associated with priorities in the development of industry and the country as a whole. The article analyzes the current situation in the industry. An attempt is made to answer the question: is it possible to reverse the situation that has formed due to a series of strategic miscalculations of the past periods of the country’s development.
Tags: formation of the industry ministry of economic development of the ussr resource provision state committee for electronic technology (scet) гкэт мэп ссср ресурсное обеспечение становление отрасли
Manufacturing equipment and process materials
D. Belyanin, A. Demin
KULON LLC PRODUCTION FACILITY RE-EQUIPMENT: RECENT IMPLEMENTATIONS AND THE NEAR FUTURE DOI: 10.22184/1992-4178.2021.207.6.124.128
The article describes the current stage of re-equipment of the ceramic capacitors production facility at Kulon LLC. Upgrading is aimed both at removing outdated equipment from service and at obtaining new opportunities in terms of improving product design, automating processes, reducing the duration of the production cycle, etc. The main characteristics and advantages of new machines are given.
KULON LLC PRODUCTION FACILITY RE-EQUIPMENT: RECENT IMPLEMENTATIONS AND THE NEAR FUTURE DOI: 10.22184/1992-4178.2021.207.6.124.128
The article describes the current stage of re-equipment of the ceramic capacitors production facility at Kulon LLC. Upgrading is aimed both at removing outdated equipment from service and at obtaining new opportunities in terms of improving product design, automating processes, reducing the duration of the production cycle, etc. The main characteristics and advantages of new machines are given.
Tags: capacitor characteristics testing capacitor leads soldering machine chamber oven edge silvering multilayer ceramic capacitors packing in a blister tape production facility автомат пайки выводов конденсаторов камерные печи контроль параметров конденсаторов многослойные керамические конденсаторы производство серебрение торцов упаковка в блистерную ленту
Electronic Components
V. Gorbachev, V. Kochemasov
RESISTORS – BASIC TYPES AND CHARACTERISTICS. Part 2 DOI: 10.22184/1992-4178.2021.207.6.74.87
The article considers the resistors of various types. The information on the features, characteristics and production technologies of these components is provided.
RESISTORS – BASIC TYPES AND CHARACTERISTICS. Part 2 DOI: 10.22184/1992-4178.2021.207.6.74.87
The article considers the resistors of various types. The information on the features, characteristics and production technologies of these components is provided.
Tags: resistance resistive layer resistor substrate temperature подложка резистивный слой резистор сопротивление температура
Test & Measurements
M. Makushin
SCATTEROMETRY AND ADVANCED SEMICONDUCTOR TECHNOLOGIES DOI: 10.22184/1992-4178.2021.207.6.44.53
Optical metrology of critical dimensions based on scatterometry (OCD-scatterometry) is one of the promising approaches to maintaining the profitability of production and the required yield level.
SCATTEROMETRY AND ADVANCED SEMICONDUCTOR TECHNOLOGIES DOI: 10.22184/1992-4178.2021.207.6.44.53
Optical metrology of critical dimensions based on scatterometry (OCD-scatterometry) is one of the promising approaches to maintaining the profitability of production and the required yield level.
Tags: ai-based diffraction simulation atlas v / impulse v metrological systems critical dimensions scatterometry дифракционное моделирование на основе ии критические размеры метрологические системы atlas v и impulse v скаттерометрия
Circuit Technique
A. Voronin
ADVANCED DIGITAL SOLUTIONS FOR READOUT ELECTRONICS OF SILICON DETECTORS DOI: 10.22184/1992-4178.2021.207.6.96.108
Развитие считывающей электроники для кремниевых детекторов связано с применением субмикронных технологий, которые обеспечивают уменьшение размеров вентилей, снижение потребляемой мощности, повышение быстродействия и улучшение других характеристик. В статье рассмотрены примеры перспективных решений для цифровых устройств считывающей электроники кремниевых детекторов.
ADVANCED DIGITAL SOLUTIONS FOR READOUT ELECTRONICS OF SILICON DETECTORS DOI: 10.22184/1992-4178.2021.207.6.96.108
Развитие считывающей электроники для кремниевых детекторов связано с применением субмикронных технологий, которые обеспечивают уменьшение размеров вентилей, снижение потребляемой мощности, повышение быстродействия и улучшение других характеристик. В статье рассмотрены примеры перспективных решений для цифровых устройств считывающей электроники кремниевых детекторов.
Tags: arbitration logic calibration test system digital adaptive filtering digital signal processing readout electronics silicon detector wavelet transform арбитражная логика вейвлетное преобразование калибровочно-тестовая система кремниевый детектор считывающая электроника цифровая адаптивная фильтрация цифровая обработка сигналов
Microprocessors and FPGAs
S. Belousov
IMPLEMENTATION OF INTEGRATED PVT-SENSORS IN DESIGNS BASED ON MODERN FinFET TECHNOLOGIES DOI: 10.22184/1992-4178.2021.207.6.56.61
The article discusses general implementation principles of analysis and monitoring system of modern FinFET-based SoCs using physical parameter sensors and controllers integrated during product design phase, on the ground of hardware components of Synopsys’s SLM platform.
IMPLEMENTATION OF INTEGRATED PVT-SENSORS IN DESIGNS BASED ON MODERN FinFET TECHNOLOGIES DOI: 10.22184/1992-4178.2021.207.6.56.61
The article discusses general implementation principles of analysis and monitoring system of modern FinFET-based SoCs using physical parameter sensors and controllers integrated during product design phase, on the ground of hardware components of Synopsys’s SLM platform.
Tags: aging effect finfet heated points ic design process performance monitoring processing load distribution synopsys voltage and frequency scaling масштабирование частоты и напряжения питания мониторинг характеристик проектирование интегральных схем распределение вычислительной нагрузки точки нагрева эффект старения
Reliability and tests
A. Alykov, T. Korbankova, A. Kulibaba, A. Sashov, M. Sukonkin
X-RAY INSPECTION OF ELECTRONIC COMPONENTS DOI: 10.22184/1992-4178.2021.207.6.62.65
X-ray inspection of the internal structure of electronic components is a promising method of diagnostic non-destructive testing for detecting potentially unreliable or counterfeit products. The efficiency of the method is considered by the example of testing tantalum chip capacitors.
X-RAY INSPECTION OF ELECTRONIC COMPONENTS DOI: 10.22184/1992-4178.2021.207.6.62.65
X-ray inspection of the internal structure of electronic components is a promising method of diagnostic non-destructive testing for detecting potentially unreliable or counterfeit products. The efficiency of the method is considered by the example of testing tantalum chip capacitors.
Tags: automatic image processing tantalum chip capacitors x-ray inspection автоматическая обработка изображений рентгеновский контроль танталовые чип-конденсаторы
A. Yudin
HOW TO PEEK A NEEDLE IN A HAY-STACK, OR WHAT YOU NEED TO KNOW TO CHOOSE A NEEDLE TEST PROBE DOI: 10.22184/1992-4178.2021.207.6.66.71
The article presents an overview of the main characteristics (tip type, spring force, operating temperature range, etc.), which should be considered when choosing needle test probe.
HOW TO PEEK A NEEDLE IN A HAY-STACK, OR WHAT YOU NEED TO KNOW TO CHOOSE A NEEDLE TEST PROBE DOI: 10.22184/1992-4178.2021.207.6.66.71
The article presents an overview of the main characteristics (tip type, spring force, operating temperature range, etc.), which should be considered when choosing needle test probe.
Power electronics
V. Khasiev
HOW TO DESIGN A STABLE POWER SUPPLY OPERATING OVER A WIDE INPUT VOLTAGE RANGE DOI: 10.22184/1992-4178.2021.207.6.110.113
Maintaining the rated operating conditions of critical system components requires a stable power supply that operates over a wide input voltage range. The article describes solutions based on highly integrated converters to keep a stable bias level in the system when the input voltage changes over a wide range.
HOW TO DESIGN A STABLE POWER SUPPLY OPERATING OVER A WIDE INPUT VOLTAGE RANGE DOI: 10.22184/1992-4178.2021.207.6.110.113
Maintaining the rated operating conditions of critical system components requires a stable power supply that operates over a wide input voltage range. The article describes solutions based on highly integrated converters to keep a stable bias level in the system when the input voltage changes over a wide range.
Tags: bias voltage boost converter buck converter dual-stage converter stable power supply двухкаскадный преобразователь напряжение смещения повышающий преобразователь понижающий преобразователь стабильный источник питания
K. Szolusha, G. Li, F. Wang
DOES THE ORIENTATION OF SMPS INDUCTOR AFFECT RADIATED EMI? DOI: 10.22184/1992-4178.2021.207.6.114.119
The article discusses the design features of inductors that affect the level of electromagnetic interference of switch mode power supplies, as well as the results of testing the LED driver demo board for radiated emissions with two inductor orientations.
DOES THE ORIENTATION OF SMPS INDUCTOR AFFECT RADIATED EMI? DOI: 10.22184/1992-4178.2021.207.6.114.119
The article discusses the design features of inductors that affect the level of electromagnetic interference of switch mode power supplies, as well as the results of testing the LED driver demo board for radiated emissions with two inductor orientations.
Tags: board layout conducted emissions emi inductor radiated emissions switching node switch mode power supply terminal design дроссель излучаемые помехи импульсный источник питания коммутационный узел компоновка платы кондуктивные помехи конструкция выводов электромагнитные помехи
V. Samokhin, D. Samokhin, E. Babkin, I. Sukhostavsky
OPTIONS FOR INTERFERENCE (HIGHER HARMONICS) SUPPRESSION IN INDUSTRIAL ELECTRICAL NETWORKS DOI: 10.22184/1992-4178.2021.207.6.120.123
The article considers the solutions for interference (higher harmonics) suppression in industrial electrical networks using rejection filters.
OPTIONS FOR INTERFERENCE (HIGHER HARMONICS) SUPPRESSION IN INDUSTRIAL ELECTRICAL NETWORKS DOI: 10.22184/1992-4178.2021.207.6.120.123
The article considers the solutions for interference (higher harmonics) suppression in industrial electrical networks using rejection filters.
Tags: filters industrial electrical networks interference помехи промышленные электрические сети фильтры
for Engineers
Electromechanical components
M. Samoylova
ODU AMC® CONNECTORS FOR MILITARY EQUIPMENT, SECURITY SYSTEMS AND COMMUNICATIONS DOI: 10.22184/1992-4178.2021.207.6.88.94
Разъемы семейства ODU AMC® производства компании ODU из Баварского города Мюльдорф широко используются в современной связной аппаратуре. Представлены их основные характеристики и некоторые проекты с этими соединителями.
ODU AMC® CONNECTORS FOR MILITARY EQUIPMENT, SECURITY SYSTEMS AND COMMUNICATIONS DOI: 10.22184/1992-4178.2021.207.6.88.94
Разъемы семейства ODU AMC® производства компании ODU из Баварского города Мюльдорф широко используются в современной связной аппаратуре. Представлены их основные характеристики и некоторые проекты с этими соединителями.