rus
Issue #2/2026
A. Bobryshov
MATHEMATICAL MODEL OF ACCURACY DYNAMICS FOR DIGITAL INSTRUMENTATION UNDER SHORT-TERM TEMPERATURE EXPOSURE
MATHEMATICAL MODEL OF ACCURACY DYNAMICS FOR DIGITAL INSTRUMENTATION UNDER SHORT-TERM TEMPERATURE EXPOSURE
DOI: 10.22184/1992-4178.2026.254.2.94.101
The study examines the effect of short-term temperature exposure on the operation of digital instrumentation. The temperature dependence of ammeter measurement errors is investigated experimentally. A mathematical model is developed that enables diagnostics of instrumentation under various external thermal conditions.
Tags: instrumentation johnson – nyquist noise mathematical model temperature coefficient контрольно-измерительный прибор математическая модель температурный коэффициент шум джонсона – найквиста
Subscribe to the journal Electronics: STB to read the full article.
The study examines the effect of short-term temperature exposure on the operation of digital instrumentation. The temperature dependence of ammeter measurement errors is investigated experimentally. A mathematical model is developed that enables diagnostics of instrumentation under various external thermal conditions.
Tags: instrumentation johnson – nyquist noise mathematical model temperature coefficient контрольно-измерительный прибор математическая модель температурный коэффициент шум джонсона – найквиста
Subscribe to the journal Electronics: STB to read the full article.
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