rus
Issue #6/2025
A. Stempkovsky, E. Kozhevnikov, E. Demidov, R. Soloviev, D. Telpukhov, L. Pereverzev, V. Kartashev, V. Dozhdev, I. Nazarov, A. Tretyakov
SPECIAL TYPES OF ANALYSIS FOR MODERN ICs: CHALLENGES OF NANOMETER TECHNOLOGIES AND APPLICATION OF AI METHODS
SPECIAL TYPES OF ANALYSIS FOR MODERN ICs: CHALLENGES OF NANOMETER TECHNOLOGIES AND APPLICATION OF AI METHODS
DOI: 10.22184/1992-4178.2025.247.6.76.82
The article presents an overview of special types of analysis for modern ICs that take into account such effects as IR drop in power buses, electromigration and signal integrity violation. Methods for implementing special types of analysis in design tools, including using machine learning, are considered.
Tags: cad design tool electromigration analysis ic ir drop analysis machine learning methods signal integrity analysis timing violation анализ падения напряжения анализ целостности сигналов анализ эффектов электромиграции инструмент проектирования ис методы машинного обучения нарушение тайминга сапр
Subscribe to the journal Electronics: STB to read the full article.
The article presents an overview of special types of analysis for modern ICs that take into account such effects as IR drop in power buses, electromigration and signal integrity violation. Methods for implementing special types of analysis in design tools, including using machine learning, are considered.
Tags: cad design tool electromigration analysis ic ir drop analysis machine learning methods signal integrity analysis timing violation анализ падения напряжения анализ целостности сигналов анализ эффектов электромиграции инструмент проектирования ис методы машинного обучения нарушение тайминга сапр
Subscribe to the journal Electronics: STB to read the full article.
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