rus
Issue #9/2021
А. Voronin
TIME MEASUREMENT AND CLOCK FREQUENCIES GENERATION IN READOUT ELECTRONICS FOR SILICON DETECTORS
TIME MEASUREMENT AND CLOCK FREQUENCIES GENERATION IN READOUT ELECTRONICS FOR SILICON DETECTORS
DOI: 10.22184/1992-4178.2021.210.9.106.120
The article discusses the main methods of time stamps formation, methods of time measurement errors compensation, solutions for clock frequencies generation in the readout electronics of silicon detectors for experiments in the field of high-energy physics and physics of cosmic rays.
The article discusses the main methods of time stamps formation, methods of time measurement errors compensation, solutions for clock frequencies generation in the readout electronics of silicon detectors for experiments in the field of high-energy physics and physics of cosmic rays.
Теги: clock generation pll readout electronics silicon detector time measurement error time stamp кремниевый детектор метка времени погрешность измерения времени считывающая электроника фапч формирование тактовой частоты
TIME MEASUREMENT AND CLOCK FREQUENCIES GENERATION IN READOUT ELECTRONICS FOR SILICON DETECTORS
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