rus
Issue #6/2024
D. Selin
BASIC MECHANISMS OF INFLUENCE OF SPECIAL FACTORS ON THE SEMICONDUCTOR STRUCTURE
BASIC MECHANISMS OF INFLUENCE OF SPECIAL FACTORS ON THE SEMICONDUCTOR STRUCTURE
DOI: 10.22184/1992-4178.2024.237.6.42.46
The article describes the effects of degradation of electrical and parametric indicators of semiconductor structures when exposed to ionizing radiation. A classification of reversible
and irreversible radiation effects is given. The result of the work is a theoretical model of the physics of the interaction of special factors with the semiconductor structure.
The article describes the effects of degradation of electrical and parametric indicators of semiconductor structures when exposed to ionizing radiation. A classification of reversible
and irreversible radiation effects is given. The result of the work is a theoretical model of the physics of the interaction of special factors with the semiconductor structure.
Теги: compton scattering ionizing radiation photoelectric effect radiation defects reliability of electronic equipment semiconductor structure ионизирующее излучение комптоновское рассеяние надежность радиоэлектронной аппаратуры полупроводниковая структура радиационные дефекты фотоэлектрический эффект
BASIC MECHANISMS OF INFLUENCE OF SPECIAL FACTORS ON THE SEMICONDUCTOR STRUCTURE
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