rus
Issue #1/2025
S. Efimenko, N. Kovalchuk, V. Smolich
FEATURES OF BURN-IN TESTING OF SEMICONDUCTOR ELECTRONICS PRODUCTS
FEATURES OF BURN-IN TESTING OF SEMICONDUCTOR ELECTRONICS PRODUCTS
DOI: 10.22184/1992-4178.2025.242.1.118.125
The article provides an overview and classification of equipment for burn-in testing in small-scale and serial production at electronics industry enterprises, as well as during incoming inspection at consumers. The main characteristics of burn-in test systems manufactured by domestic enterprises are presented.
Tags: burn-in testing burn-in test system detection of hidden defects failure rate intermittent failures выявление скрытых дефектов интенсивность отказов перемежающиеся отказы стенд этт электротермотренировка
Subscribe to the journal Electronics: STB to read the full article.
The article provides an overview and classification of equipment for burn-in testing in small-scale and serial production at electronics industry enterprises, as well as during incoming inspection at consumers. The main characteristics of burn-in test systems manufactured by domestic enterprises are presented.
Tags: burn-in testing burn-in test system detection of hidden defects failure rate intermittent failures выявление скрытых дефектов интенсивность отказов перемежающиеся отказы стенд этт электротермотренировка
Subscribe to the journal Electronics: STB to read the full article.
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