rus
Issue #6/2025
V. Plebanovich, V. Svetenkova, V. Grishkevich
PHOTON EMISSION IS AN INNOVATIVE METHOD FOR ANALYZING DEFECTS IN MICROELECTRONICS
PHOTON EMISSION IS AN INNOVATIVE METHOD FOR ANALYZING DEFECTS IN MICROELECTRONICS
DOI: 10.22184/1992-4178.2025.247.6.150.152
The analytical complex “Photon”, developed jointly by “Optoelectronic systems” JSC and NTC “Belmicrosystems”, solves the problem of identifying hidden defects of integrated circuits, such as structural defects of the crystal lattice, local current leaks and overheating of power elements.
Tags: defects ic photon emission дефекты микросхема фотонная эмиссия
Subscribe to the journal Electronics: STB to read the full article.
The analytical complex “Photon”, developed jointly by “Optoelectronic systems” JSC and NTC “Belmicrosystems”, solves the problem of identifying hidden defects of integrated circuits, such as structural defects of the crystal lattice, local current leaks and overheating of power elements.
Tags: defects ic photon emission дефекты микросхема фотонная эмиссия
Subscribe to the journal Electronics: STB to read the full article.
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