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DOI: 10.22184/1992-4178.2022.215.4.110.113
The article proposes the solution for the metrological support of phase noise measuring instruments using a reference exposure based on a frequency-modulated signal.
The article proposes the solution for the metrological support of phase noise measuring instruments using a reference exposure based on a frequency-modulated signal.
Теги: frequency-modulated signal measuring instruments phase noise средства измерений фазовый шум частотно-модулированный сигнал
ISSUES OF METROLOGICAL SUPPORT OF PHASE NOISE MEASURING INSTRUMENTS
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