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Issue #6/2022
A. Belous, S. Efimenko, V. Smolich
FEATURES OF ELECTRONIC COMPONENTS TESTING ORGANIZATION IN THE TEMPERATURE RANGE
FEATURES OF ELECTRONIC COMPONENTS TESTING ORGANIZATION IN THE TEMPERATURE RANGE
DOI: 10.22184/1992-4178.2022.217.6.158.166
The article presents an overview, classification and main characteristics of equipment for serial production testing of ICs and semiconductor devices in a wide temperature range. It is shown that both automated and non-automated systems can be used for testing.
The article presents an overview, classification and main characteristics of equipment for serial production testing of ICs and semiconductor devices in a wide temperature range. It is shown that both automated and non-automated systems can be used for testing.
Теги: collie 301hc and exceed 8808 handlers mh200 and mh250 gravity handlers pass-through chambers thermojet and thermostream thermostatic devices thermojet и thermostream uik.im 1-19 гравитационные хендлеры mh200 и mh250 проходные камеры устройства термостатирующие уик.им 1-19 хендлеры collie 301hc и exceed 8808
FEATURES OF ELECTRONIC COMPONENTS TESTING ORGANIZATION IN THE TEMPERATURE RANGE
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